Gate Dielectric integrity : (Record no. 13311)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00613nam a2200181Ia 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20240911061350.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 190613s9999 xx 000 0 und d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0803126158 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 |
| Item number | GAT |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Gupta, Dinesh C. |
| 9 (RLIN) | 2360 |
| 245 #0 - TITLE STATEMENT | |
| Title | Gate Dielectric integrity : |
| Remainder of title | material, process, and tool qualification / |
| Statement of responsibility, etc. | Dinesh C. Gupta and George A. Brown |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | West Conshohocken : |
| Name of publisher, distributor, etc. | ASTM, |
| Date of publication, distribution, etc. | 2000 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Dielectrics |
| 9 (RLIN) | 2362 |
| Topical term or geographic name entry element | Gate Array Circuits |
| 9 (RLIN) | 2363 |
| Topical term or geographic name entry element | Integrated Circuits |
| 9 (RLIN) | 2364 |
| Topical term or geographic name entry element | Semiconductors Wafers |
| 9 (RLIN) | 2365 |
| Topical term or geographic name entry element | Silicon oxide films |
| 9 (RLIN) | 2361 |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Total checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Reference Collection | Reference Collection | 06/13/2019 | 621.38152 GAT | LC-41519/c1 | 06/13/2019 | 06/13/2019 | Books |