Fault-tolerance and reliability and techniques for high-denisty random-access memories/ (Record no. 43227)

MARC details
000 -LEADER
fixed length control field 005780000a22001570004500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20251028083810.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 190625s9999 xx 000 0 und d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 8120322142
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.39573
Item number CHA
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Chakraborty, Kanad
9 (RLIN) 5317
245 #0 - TITLE STATEMENT
Title Fault-tolerance and reliability and techniques for high-denisty random-access memories/
Statement of responsibility, etc. Kanad Chakraborty and Pinaki Mazumder
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. New Delhi :
Name of publisher, distributor, etc. Prentice Hall,
Date of publication, distribution, etc. 2002
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Fault-Tolerance and Reliability
9 (RLIN) 5320
Topical term or geographic name entry element Random-Access Memories
9 (RLIN) 5318
Topical term or geographic name entry element Techniques For High-Denisty
9 (RLIN) 5319

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