Fault-tolerance and reliability and techniques for high-denisty random-access memories/ (Record no. 43227)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 005780000a22001570004500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20251028083810.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 190625s9999 xx 000 0 und d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 8120322142 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.39573 |
| Item number | CHA |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Chakraborty, Kanad |
| 9 (RLIN) | 5317 |
| 245 #0 - TITLE STATEMENT | |
| Title | Fault-tolerance and reliability and techniques for high-denisty random-access memories/ |
| Statement of responsibility, etc. | Kanad Chakraborty and Pinaki Mazumder |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | New Delhi : |
| Name of publisher, distributor, etc. | Prentice Hall, |
| Date of publication, distribution, etc. | 2002 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Fault-Tolerance and Reliability |
| 9 (RLIN) | 5320 |
| Topical term or geographic name entry element | Random-Access Memories |
| 9 (RLIN) | 5318 |
| Topical term or geographic name entry element | Techniques For High-Denisty |
| 9 (RLIN) | 5319 |
No items available.
