Jeon, Gwanggil. Advanced Machine Learning and Deep Learning Approaches for Remote Sensing / Gwanggil Jeon. - Bejing : MDPI, c2023. - vii, 351p. : ill. ; 30cm. Includes references & index. ISBN: 9783036579467(hbk.) Subjects--Topical Terms: Remote Sensing. Dewey Class. No.: 621.3678 / JEO