<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[MUET Library &amp; Online Information Center, Jamshoro Search for 'su:&quot;Aptitude Tests.&quot;']]> </title> <link> /cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Aptitude%20Tests.%22&#38;sort_by=relevance&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Aptitude%20Tests.%22&#38;sort_by=relevance&#38;format=rss"/> <description> <![CDATA[ Search results for 'su:&quot;Aptitude Tests.&quot;' at MUET Library &amp; Online Information Center, Jamshoro]]> </description> <opensearch:totalResults>8</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Aptitude%20Tests.%22&#38;sort_by=relevance&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dsu%253A%2522Aptitude%2520Tests.%2522" startPage="" /> <item> <title> GATE (graduate aptitude test in engineering) : electrical engineering 2019 / </title> <dc:identifier>ISBN:9789352868438</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=10273</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9352868439.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Noida, India : Pearson, 2017 .<br /> Lxxviii, 1070 P. : 25 cm. + 1 CD ROM..<br /> 9789352868438 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=10273">Place hold on <em>GATE (graduate aptitude test in engineering) :</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=10273</guid> </item> <item> <title> Comprehensive ISSB tests guide / </title> <dc:identifier>ISBN:</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=11643</link> <description> <![CDATA[ <p> By Bari, Tasneem..<br /> Lahore : Dogar Publication 2016 .<br /> various pages : 24 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=11643">Place hold on <em>Comprehensive ISSB tests guide /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=11643</guid> </item> <item> <title> PTE academic : : pearson test of english academic / </title> <dc:identifier>ISBN:9781447937944 (pbk.)</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=11843</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1447937945.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Essex, England : Pearson, 2016 .<br /> 208 p. : 29 cm..<br /> 9781447937944 (pbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=11843">Place hold on <em>PTE academic : :</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=11843</guid> </item> <item> <title> GRE prep plus 2018 / </title> <dc:identifier>ISBN:9781506219837 (pbk.)</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=13372</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1506219837.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> New York : Kaplan Publishing, 2017 9781506219837 (pbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=13372">Place hold on <em>GRE prep plus 2018 /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=13372</guid> </item> <item> <title> GATE (graduate aptitude test in engineering) : electrical engineering 2019 / </title> <dc:identifier>ISBN:9789352868438</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=37787</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9352868439.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Noida, India : Pearson, 2017 .<br /> Lxxviii, 1070 P. : 25 cm. + 1 CD ROM..<br /> 9789352868438 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=37787">Place hold on <em>GATE (graduate aptitude test in engineering) :</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=37787</guid> </item> <item> <title> Comprehensive ISSB tests guide / </title> <dc:identifier>ISBN:</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=39157</link> <description> <![CDATA[ <p> By Bari, Tasneem..<br /> Lahore : Dogar Publication 2016 .<br /> various pages : 24 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=39157">Place hold on <em>Comprehensive ISSB tests guide /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=39157</guid> </item> <item> <title> PTE academic : : pearson test of english academic / </title> <dc:identifier>ISBN:9781447937944 (pbk.)</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=39357</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1447937945.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Essex, England : Pearson, 2016 .<br /> 208 p. : 29 cm..<br /> 9781447937944 (pbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=39357">Place hold on <em>PTE academic : :</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=39357</guid> </item> <item> <title> GRE prep plus 2018 / </title> <dc:identifier>ISBN:9781506219837 (pbk.)</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=40886</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1506219837.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> New York : Kaplan Publishing, 2017 9781506219837 (pbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=40886">Place hold on <em>GRE prep plus 2018 /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=40886</guid> </item> </channel> </rss>
