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	1.		Wafer level reliability of advanced CMOS devices and processes / Edited by Yi Zhao. by Zhao, Yi Publication details: New York : Nova Science Publishers, c2008 Availability: Items available for loan: Reference Collection (1)Call number: 621.38152 ZHA. Place hold
	2.		Research design and methods : a process approach / Kenneth S. Bordens and Bruce B. Abbott. by Bordens, Kenneth S Abbott, Bruce B Edition: 10th ed. Material type: Text Publication details: New York : McGraw-Hill, c2011 Availability: Items available for loan: Mehran University ISTD (1)Call number: 150.72 BOR. Place hold
	3.		Research design and methods : Kenneth S. Bordens & Bruce B. Abbott. a process approach / by Bordens, Kenneth S Abbott, Bruce B Edition: 10th ed. Material type: Text Publication details: New York : McGraw-Hill, 2018 Availability: Items available for reference: Reference Collection: Not for loan (1)Call number: 150.72 BOR.
	4.		Wafer level reliability of advanced CMOS devices and processes / Edited by Yi Zhao. by Zhao, Yi Publication details: New York : Nova Science Publishers, c2008 Availability: No items available.
	5.		Research design and methods : a process approach / Kenneth S. Bordens and Bruce B. Abbott. by Bordens, Kenneth S Abbott, Bruce B Edition: 10th ed. Publication details: New York : McGraw-Hill, c2011 Availability: No items available.
	6.		Research design and methods : Kenneth S. Bordens & Bruce B. Abbott. a process approach / by Bordens, Kenneth S Abbott, Bruce B Edition: 10th ed. Publication details: New York : McGraw-Hill, 2018 Availability: No items available.

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